List
- Evers, E., van Tuijl, N. A., Lamers, R., de Jager, A. G. & Oomen, T. A. E., Fast and Accurate Identification of Thermal Dynamics for Precision Motion Control: Exploiting Transient Data and Additional Disturbance Inputs. Oct 2020, In : IFAC Mechatronics. 70, 8 p., 102401. https://doi.org/10.1016/j.mechatronics.2020.102401
- Noël, J-P., Evers, E., & Oomen, T. A. E. (2020). Nonlinear Data-driven Identification of a Thermo-electric System. 100. Abstract from 39th Benelux Meeting on Systems and Control, Elspeet, Netherlands.
- Scheepens, S. J. M. C., Bukkems, B., Ruijl, T., Evers, E., & Oomen, T. A. E. (2020). Modelling & Identification for Thermal Control of Cooling Water with Varying Flow. Abstract from Euspen Special Interest Group Meeting: Thermal Issues, Aachen, Germany.
- Evers, E., Voorhoeve, R. J., & Oomen, T. A. E. (Accepted/In press). On Frequency Response Function Identification for Advanced Motion Control. In IEEE 16th International Workshop on Advanced Motion Control, Kristiansand, Norway. https://doi.org/10.1109/AMC44022.2020.9244317
- Evers, E., Slenders, R., van Gils, R., & Oomen, T. A. E. (Accepted/In press). Temperature-Dependent Modeling of Thermoelectric Elements. Abstract from 2020 DSPE Conference on Precision Mechatronics, Sint Michielsgestel, Netherlands. https://arxiv.org/abs/2006.10379
- Evers, E., Slenders, R., van Gils, R., & Oomen, T. A. E. (Accepted/In press). Temperature-Dependent Modeling of Thermoelectric Elements. In 21st IFAC World Congress, Berlin, Germany.
- Evers, E., van Tuijl, N. A., Lamers, R., & Oomen, T. A. E. (2019). Identifying thermal dynamics for precision motion control. IFAC-PapersOnLine, 52(15), 73-78. https://doi.org/10.1016/j.ifacol.2019.11.652
- Evers, E., Lamers, R., & Oomen, T. (2019). Thermally induced deformations in electron microscopy: challenges and opportunities for system identification. Mikroniek, (2), 12-18.
- Evers, E., van de Wal, M., & Oomen, T. (2019). Beyond decentralized wafer/reticle stage control design: a double-Youla approach for enhancing synchronized motion. Control Engineering Practice, 83, 21-32. https://doi.org/10.1016/j.conengprac.2018.10.011
- Evers, E., de Jager, B., & Oomen, T. A. E. (2019). Identifying thermal dynamics for precision motion control. 109. Abstract from 38th Benelux Meeting on Systems and Control, Lommel, Belgium.
- Evers, E., de Jager, B., & Oomen, T. A. E. (2019). Local rational approximation with prescribed poles for improved frequency response function identification. Poster session presented at 28th European Research Network on System Identification (ERNSI) workshop, Maastricht, Netherlands.
- Evers, E., de Jager, B., & Oomen, T. (2018). Thermo-mechanical behavior in precision motion control: unified framework for fast and accurate FRF identification. In IECON 2018 – 44th Annual Conference of the IEEE Industrial Electronics Society (pp. 4618 – 4623). [8592781] Piscataway: Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/IECON.2018.8592781
- Evers, E., de Jager, B., & Oomen, T. (2018). Improved Local Rational Method by incorporating system knowledge: with application to mechanical and thermal dynamical systems. IFAC-PapersOnLine, 51(15), 808-813. https://doi.org/10.1016/j.ifacol.2018.09.127
- Evers, E., de Jager, B., & Oomen, T. (2018). Advanced identification and control for thermal systems. Poster session presented at 2018 DSPE Conference on Precision Mechatronics (DSPE2018), Sint Michielsgestel, Netherlands.
- Evers, E., Oomen, T. A. E., & de Jager, A. G. (2018). Local Rational Method with prior system knowledge: with application to mechanical and thermal systems. 21. Abstract from 37th Benelux Meeting on Systems and Control, Soesterberg, Netherlands.
- Evers, E., van de Wal, M. M. J., & Oomen, T. A. E. (2017). Synchronizing decentralized control loops for overall performance enhancement : a Youla framework applied to a wafer scanner. IFAC-PapersOnLine, 50(1), 10845-10850. https://doi.org/10.1016/j.ifacol.2017.08.2382
- Evers, E., van de Wal, M. M. J., & Oomen, T. A.E. (2017). Synchronized motion control for overall performance enhancement : a Youla framework applied to a wafer scanner. In 36th Benelux Meeting on Systems and Control, 28-30 March 2017, Spa, Belgium (pp. 72)
Timeline
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