Evers, E., Lamers, R., & Oomen, T. In Mikroniek, (2), 12-18. Abstract: Thermal effects are becoming increasingly important in efforts…
Read MoreAcademic Publications
This includes all academic publications, generally in my role as PhD candidate.
Identifying thermal dynamics for precision motion control.
Evers, E., de Jager, B., & Oomen, T. A. E. 38th Benelux Meeting on Systems and Control, Lommel, Belgium
Read MoreBeyond decentralized wafer/reticle stage control design: a double-Youla approach for enhancing synchronized motion.
Evers, E., van de Wal, M., & Oomen, T. In Control Engineering Practice 83, 21-32 Abstract: Industrial waferscanners often consists…
Read MoreThermo-mechanical behavior in precision motion control: unified framework for fast and accurate FRF identification
Evers, E., de Jager, B., & Oomen, T. In IECON 2018 – 44th Annual Conference of the IEEE Industrial Electronics…
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Advanced identification and control for thermal systems.
Evers, E., de Jager, B., & Oomen, T. 2018 DSPE Conference on Precision Mechatronics (DSPE2018), Sint Michielsgestel, Netherlands. Abstract:
Read MoreImproved Local Rational Method by incorporating system knowledge: with application to mechanical and thermal dynamical systems
Evers, E., de Jager, B., & Oomen, T. 18th IFAC Symposium on System Identification, SYSID 2018, took place in Stockholm,…
Read MoreLocal Rational Method with prior system knowledge: with application to mechanical and thermal systems.
Evers, E., Oomen, T. A. E., & de Jager, A. G. 37th Benelux Meeting on Systems and Control, Soesterberg, Netherlands.
Read MoreSynchronizing decentralized control loops for overall performance enhancement : a Youla framework applied to a wafer scanner.
Evers, E., van de Wal, M. M. J., & Oomen, T. A. E. 20th World Congress of the International Federation…
Read MoreSynchronized motion control for overall performance enhancement : a Youla framework applied to a wafer scanner.
Evers, E., van de Wal, M. M. J., & Oomen, T. A. E. 36th Benelux Meeting on Systems and Control,…
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